We offer X-Ray diffraction research in the following areas:

• retained austenite contents measurement
• residual stress measurement
• stress depth distribution, depth profile (0 ÷ 250 µm)
• stress tensor calculations
• determination of micro stresses (second kind) and crystallite size
• phase analysis
• analysis of crystallite size in plastic

The Institute owns a portable diffractometer XStress3000 (made by Stresstech Oy, Finland) with the following properties:

• two-theta range 2-Teta = 125° ÷ 162°
• X-Ray tube - Cr
• spot size: 0.8 ÷ 5 mm
• can operate in any position (ie. vertical, upside down)

testing possibility:

• min. 155 mm inside diameters of tubes and rings within approx.80mm from the end of the tube opening (circumferential direction only)
• gear roots in the load direction

In addition, X-Ray Laboratory owns:

• URD-6 diffractometer (VEB Carl Zeiss JENA, GDR)
• angle range 2-Teta = 3° ÷ 155°
• accuracy ±0.005°
• X-Ray tubes: Mo, Cu, Co, Fe, Cr

Other Institute research and activities:

• microscope analysis
• x-ray microanalysis
• hardness tests
• an access to the crystallography database ICDD (over 70.000 compounds) structural studies
• biomechanics
• dynamics of mechanical systems
• strength hypotheses
• elasticity and plasticity theories
• materials technology
• rheology